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Wanchun Shi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yuhai Ma, Wanchun Shi
    A Novel Approach to the Analysis of VLSI Device Test Programs. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:471-480 [Conf]
  2. Yuhai Ma, Wanchun Shi
    OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:675-684 [Conf]
  3. Yuning Sun, Xiaoming Wang, Wanchun Shi
    An Intelligent Software-Integrated Environment of IC Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:594-603 [Conf]

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