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Samy Makar: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Samy Makar
    A layout-based approach for ordering scan chain flip-flops. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:341-347 [Conf]
  2. Samy Makar, Edward J. McCluskey
    On the Testing of Multiplexers. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:669-679 [Conf]
  3. Samy Makar, Edward J. McCluskey
    Functional Tests for Scan Chain Latches. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:606-615 [Conf]
  4. Samy Makar, Edward J. McCluskey
    ATPG for scan chain latches and flip-flops. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:364-369 [Conf]
  5. Samy Makar, Edward J. McCluskey
    Checking experiments to test latches. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:196-201 [Conf]
  6. Subhasish Mitra, Edward J. McCluskey, Samy Makar
    Design for Testability and Testing of IEEE 1149.1 Tap Controller. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:247-252 [Conf]
  7. Daniel Boley, Gene H. Golub, Samy Makar, Nirmal R. Saxena, Edward J. McCluskey
    Floating Point Fault Tolerance with Backward Error Assertions. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1995, v:44, n:2, pp:302-311 [Journal]
  8. Edward J. McCluskey, Samy Makar, Samiha Mourad, Kenneth D. Wagner
    Probability models for pseudorandom test sequences. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1988, v:7, n:1, pp:68-74 [Journal]

  9. CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. [Citation Graph (, )][DBLP]

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