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Publications of Author

1. Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey
   Deformations of IC Structure in Test and Yield Learning. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:856-865 [Conf]
   
2. Thomas M. Storey
   Testing in a high volume DSM Environment. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:1422- [Conf]
   
3. Thomas M. Storey
   A Test Methodology for VLSI Chips on Silicon. [Citation Graph (0, 0)][DBLP]
   ITC, 1993, pp:359-368 [Conf]
   
4. Thomas M. Storey, C. Lapihuska, E. Atwood, L. Su
   A Test Methodology to Support an ASEM MCM Foundry. [Citation Graph (0, 0)][DBLP]
   ITC, 1994, pp:426-435 [Conf]
   
5. Thomas M. Storey, Wojciech Maly
   CMOS Bridging Fault Detection. [Citation Graph (0, 0)][DBLP]
   ITC, 1990, pp:1123-1132 [Conf]
   
6. Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske
   Stuck Fault and Current Testing Comparison Using CMOS Chip Test. [Citation Graph (0, 0)][DBLP]
   ITC, 1991, pp:311-318 [Conf]