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Anne Meixner:
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- Anne Meixner, Jash Banik
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. [Citation Graph (0, 0)][DBLP] ITC, 1996, pp:309-318 [Conf]
- Anne Meixner, Jash Banik
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. [Citation Graph (0, 0)][DBLP] ITC, 1997, pp:1043-1052 [Conf]
- Anne Meixner, Wojciech Maly
Fault Modeling for the Testing of Mixed Integrated Circuits. [Citation Graph (0, 0)][DBLP] ITC, 1991, pp:564-572 [Conf]
- Mike Tripp, T. M. Mak, Anne Meixner
Elimination of Traditional Functional Testing of Interface Timings at Intel. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:1014-1022 [Conf]
- Mike Tripp, T. M. Mak, Anne Meixner
Elimination of Traditional Functional Testing of Interface Timings at Intel. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:1448-1456 [Conf]
- T. M. Mak, Mike Tripp, Anne Meixner
Testing Gbps Interfaces without a Gigahertz Tester. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2004, v:21, n:4, pp:278-286 [Journal]
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