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Seiji Terada: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Michinobu Nakao, Seiji Kobayashi, Kazumi Hatayama, Kazuhiko Iijima, Seiji Terada
    Low overhead test point insertion for scan-based BIST. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:348-357 [Conf]

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