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Wayne M. Needham: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Wayne M. Needham
    Just how real is the SIA roadmap. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1151- [Conf]
  2. Wayne M. Needham, Naga Gollakota
    DFT Strategy for Intel Microprocessors. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:396-399 [Conf]
  3. Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
    High volume microprocessor test escapes, an analysis of defects our tests are missing. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:25-34 [Conf]
  4. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
    So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1037-1038 [Conf]
  5. Magdy S. Abadir, Jacob A. Abraham, H. Hao, C. Hunter, Wayne M. Needham, Ron G. Walther
    Microprocessor Test and Validation: Any New Avenues? [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:458-464 [Conf]
  6. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
    An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:459- [Conf]
  7. Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
    Best Methods for At-Speed Testing? [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:460-461 [Conf]
  8. Wayne M. Needham
    Nanometer Technology Challenges for Test and Test Equipment. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1999, v:32, n:11, pp:52-57 [Journal]
  9. Wayne M. Needham
    Guest Editor's Introduction: Microprocessor Testing Today. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:56-57 [Journal]

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