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Vijay Reddy: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Vijay Reddy, John Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess
    Impact of Negative Bias Temperature Instability on Product Parametric Drift. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:148-155 [Conf]
  2. Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan
    Impact of negative bias temperature instability on digital circuit reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:1, pp:31-38 [Journal]
  3. Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
    Gate oxide failures due to anomalous stress from HBM ESD testers. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:656-665 [Journal]

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