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Vijay Reddy:
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Publications of Author
- Vijay Reddy, John Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess
Impact of Negative Bias Temperature Instability on Product Parametric Drift. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:148-155 [Conf]
- Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan
Impact of negative bias temperature instability on digital circuit reliability. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:1, pp:31-38 [Journal]
- Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
Gate oxide failures due to anomalous stress from HBM ESD testers. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:5-6, pp:656-665 [Journal]
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