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Narumi Sakashita: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe
    A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:319-324 [Conf]
  2. Eiichi Teraoka, Toru Kengaku, Ikuo Yasui, Kazuyuki Ishikawa, Takahiro Matsuo, Hideyuki Wakada, Narumi Sakashita, Yukihiko Shimazu, Takeshi Tokuda
    A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:791-796 [Conf]
  3. Takeshi Tokuda, Jiro Korematsu, Yukihiko Shimazu, Narumi Sakashita, Tohru Kengaku, Toshiki Fugiyama, Takio Ohno, Osamu Tomisawa
    A macrocell approach for VLSI processor design. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1988, v:7, n:12, pp:1272-1277 [Journal]

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