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Akihiko Yasuoka: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe
    A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:319-324 [Conf]

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