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Carol de Benito: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jaume Segura, Carol de Benito, A. Rubio, Charles F. Hawkins
    A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:544-551 [Conf]
  2. José Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura
    Leakage Power Characterization Considering Process Variations. [Citation Graph (0, 0)][DBLP]
    PATMOS, 2006, pp:66-74 [Conf]
  3. Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura
    Impact of Thermal Gradients on Clock Skew and Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:5, pp:414-424 [Journal]
  4. José Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura
    Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:1271-1276 [Conf]

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