Paulo Marcos Siqueira Bueno, Mario Jino Automatic Test Data Generation for Program Paths Using Genetic Algorithms. [Citation Graph (0, 0)][DBLP] International Journal of Software Engineering and Knowledge Engineering, 2002, v:12, n:6, pp:691-710 [Journal]
Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. [Citation Graph (, )][DBLP]
Automatic test data generation using particle systems. [Citation Graph (, )][DBLP]
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