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Piet W. Verbeek :
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Michiel de Bakker , Piet W. Verbeek , Gijs K. Steenvoorden Design Considerations for a Range Image Sensor Containing a PSD-array and An On-chip Multiplexer. [Citation Graph (0, 0)][DBLP ] 3DIM, 1997, pp:11-18 [Conf ] Judith Dijk , Michael van Ginkel , Rutger J. van Asselt , Lucas J. van Vliet , Piet W. Verbeek A New Sharpness Measure Based on Gaussian Lines and Edges. [Citation Graph (0, 0)][DBLP ] CAIP, 2003, pp:149-156 [Conf ] Cris L. Luengo Hendriks , Michael van Ginkel , Piet W. Verbeek , Lucas J. van Vliet The Generalised Radon Transform: Sampling and Memory Considerations. [Citation Graph (0, 0)][DBLP ] CAIP, 2003, pp:681-688 [Conf ] Piet W. Verbeek , Judith Dijk The D-Dimensional Inverse Vector-Gradient Operator and Its Application for Scale-Free Image Enhancement. [Citation Graph (0, 0)][DBLP ] CAIP, 2003, pp:738-745 [Conf ] Peter Bakker , Lucas J. van Vliet , Piet W. Verbeek Edge Preserving Orientation Adaptive Filtering. [Citation Graph (0, 0)][DBLP ] CVPR, 1999, pp:1535-1540 [Conf ] Frans C. A. Groen , Piet W. Verbeek , M. van der Ploeg Computation of DNA-based parameters from chromosome scans. [Citation Graph (0, 0)][DBLP ] Digital Image Processing, 1977, pp:21-30 [Conf ] Piet W. Verbeek , Leo Dorst , Ben J. H. Verwer , Frans C. A. Groen Collision Avoidance and Path Finding through Constrained Distance Tranceformation in Robot State Space. [Citation Graph (0, 0)][DBLP ] IAS, 1986, pp:627-634 [Conf ] Peter Bakker , Lucas J. van Vliet , Piet W. Verbeek Confidence and Curvature Estimation of Curvilinear Structures in 3-D. [Citation Graph (0, 0)][DBLP ] ICCV, 2001, pp:139-144 [Conf ] Dick de Ridder , Robert P. W. Duin , Piet W. Verbeek , Lucas J. van Vliet On the Application of Neural Networks to Non-Linear Image Processing Tasks. [Citation Graph (0, 0)][DBLP ] ICONIP, 1998, pp:161-165 [Conf ] Bernd Rieger , Frederik J. Timmermans , Lucas J. van Vliet , Piet W. Verbeek Curvature Estimation of Surfaces in 3D Grey-Value Images. [Citation Graph (0, 0)][DBLP ] ICPR (1), 2002, pp:684-687 [Conf ] René G. de Vries , Piet W. Verbeek Scale-Adaptive Landmark Detection, Classification and Size Estimation in 3D Object-Background Images. [Citation Graph (0, 0)][DBLP ] ICPR, 2000, pp:7026-7029 [Conf ] Lucas J. van Vliet , Piet W. Verbeek , Ian T. Young Quantitative Imaging: How to Measure Size Features in Digitized Images. [Citation Graph (0, 0)][DBLP ] ISBI, 2004, pp:1227-1230 [Conf ] Michael van Ginkel , M. A. Kraaijveld , Lucas J. van Vliet , E. P. Reding , Piet W. Verbeek , H. J. Lammers Robust Curve Detection Using a Radon Transform in Orientation Space. [Citation Graph (0, 0)][DBLP ] SCIA, 2003, pp:125-132 [Conf ] Bernd Rieger , Lucas J. van Vliet , Piet W. Verbeek Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images. [Citation Graph (0, 0)][DBLP ] SCIA, 2003, pp:262-267 [Conf ] Frans A. Gerritsen , Piet W. Verbeek Implementation of cellular-logic operators using 3*3 convolution and table lookup hardware. [Citation Graph (0, 0)][DBLP ] Computer Vision, Graphics, and Image Processing, 1984, v:27, n:1, pp:115-123 [Journal ] Ben J. H. Verwer , Lucas J. van Vliet , Piet W. Verbeek Binary and Grey-Value Skeletons: Metrics and Algorithms. [Citation Graph (0, 0)][DBLP ] IJPRAI, 1993, v:7, n:5, pp:1287-1308 [Journal ] Dick de Ridder , Robert P. W. Duin , Piet W. Verbeek The Applicability of Neural Networks to Non-linear Image Processing. [Citation Graph (0, 0)][DBLP ] Pattern Anal. Appl., 1999, v:2, n:2, pp:111-128 [Journal ] Bernd Rieger , Frederik J. Timmermans , Lucas J. van Vliet , Piet W. Verbeek On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Pattern Anal. Mach. Intell., 2004, v:26, n:8, pp:1088-1094 [Journal ] Piet W. Verbeek , Lucas J. van Vliet On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:7, pp:726-733 [Journal ] Ben J. H. Verwer , Piet W. Verbeek , Simon T. Dekker An Efficient Uniform Cost Algorithm Applied to Distance Transforms. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Pattern Anal. Mach. Intell., 1989, v:11, n:4, pp:425-429 [Journal ] Joost van de Weijer , Lucas J. van Vliet , Piet W. Verbeek , Michael van Ginkel Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:9, pp:1035-1042 [Journal ] Frans C. A. Groen , Piet W. Verbeek , N. de Jong , J. W. Klumper The smallest box around a package. [Citation Graph (0, 0)][DBLP ] Pattern Recognition, 1981, v:14, n:1-6, pp:173-178 [Journal ] Cris L. Luengo Hendriks , Michael van Ginkel , Piet W. Verbeek , Lucas J. van Vliet The generalized Radon transform: Sampling, accuracy and memory considerations. [Citation Graph (0, 0)][DBLP ] Pattern Recognition, 2005, v:38, n:12, pp:2494-2505 [Journal ] Piet W. Verbeek , Ben J. H. Verwer Shading from shape, the eikonal equation solved by grey-weighted distance transform. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1990, v:11, n:10, pp:681-690 [Journal ] Lucas J. van Vliet , Piet W. Verbeek Edge localization by MoG filters: Multiple-of-Gaussians. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1994, v:15, n:5, pp:485-496 [Journal ] Search in 0.002secs, Finished in 0.003secs