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Olivier Bonnaud:
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- Olivier Bonnaud, P. Münster, H. Lhermite, C. Diaconescu
Interactive Microelectronics Technology Course Available on Website. [Citation Graph (0, 0)][DBLP] MSE, 2001, pp:14-15 [Conf]
- G. Gautier, S. Crand, Olivier Bonnaud
Dynamic electrical characterization of CMOS-like Thin Film Transistor circuits. [Citation Graph (0, 0)][DBLP] MSE, 2003, pp:14-15 [Conf]
- D. Guillet, K. Mourgues, R. Rogel, H. Lhermite, Olivier Bonnaud
Student Realization in Cleanroom of Silicon-Germanium Thin Film Transistors. [Citation Graph (0, 0)][DBLP] MSE, 1999, pp:69-70 [Conf]
- Sandrine Lucas, N. Outaleb, Olivier Bonnaud, J. Pine
Realization and SEM Observation of Polysilicon and Aluminium Cantilever Using Surface Micromachining Technology. [Citation Graph (0, 0)][DBLP] MSE, 1999, pp:28-29 [Conf]
- Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1325-1329 [Journal]
- Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud
Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1331-1334 [Journal]
- Xavier Gagnard, Yannick Rey-Tauriac, Olivier Bonnaud
Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1335-1340 [Journal]
- E. Carvou, F. Le Bihan, A. C. Salaün, R. Rogel, Olivier Bonnaud, Yannick Rey-Tauriac, Xavier Gagnard, L. Roland
Reliability improvement of high value doped polysilicon-based resistors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:9-11, pp:1369-1372 [Journal]
- Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, B. Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1531-1535 [Journal]
- Yannick Rey-Tauriac, O. de Sagazan, M. Taurin, Olivier Bonnaud
Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1865-1869 [Journal]
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