|
Search the dblp DataBase
T. Devoivre:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- T. Devoivre, M. Lunenborg, C. Julien, J.-P. Carrere, P. Ferreira, W. J. Toren, A. VandeGoor, P. Gayet, T. Berger, O. Hinsinger, P. Vannier, Y. Trouiller, Y. Rody, P.-J. Goirand, R. Palla, I. Thomas, F. Guyader, D. Roy, B. Borot, N. Planes, S. Naudet, F. Pico, D. Duca, F. Lalanne, D. Heslinga, M. Haond
Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC). [Citation Graph (0, 0)][DBLP] MTDT, 2002, pp:157-162 [Conf]
- M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo
Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1361-1366 [Journal]
Search in 0.001secs, Finished in 0.001secs
|