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Massimo Vanzi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Francesca Mighela, Cristian Perra, Massimo Vanzi
    Video Streaming in Electron Microscopy Applications. [Citation Graph (0, 0)][DBLP]
    VLBV, 2005, pp:115-120 [Conf]
  2. Claudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi
    A physically based mobility model for numerical simulation of nonplanar devices. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1988, v:7, n:11, pp:1164-1171 [Journal]
  3. Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi
    A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:4, pp:499-507 [Journal]
  4. Zhiping Yu, Robert W. Dutton, Massimo Vanzi
    An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:1, pp:41-45 [Journal]
  5. Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:8, pp:1143-1144 [Journal]
  6. M. Giglio, G. Martines, G. Mura, Simona Podda, Massimo Vanzi
    An automated lifetest equipment for optical emitters. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1311-1315 [Journal]
  7. C. Caprile, I. De Munari, M. Improntac, Simona Podda, A. Scorzoni, Massimo Vanzi
    A specimen-current branching approach for FA of long Electromigration test lines. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1715-1718 [Journal]
  8. Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi
    Backside Failure Analysis of GaAs ICs after ESD tests. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1293-1298 [Journal]
  9. L. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
    ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1303-1306 [Journal]
  10. Fausto Fantini, Massimo Vanzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1249- [Journal]
  11. Massimo Vanzi, G. Salmini, R. Pastorelli, S. Pessina, P. Furcas
    Reliability tests on WDM filters. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1317-1321 [Journal]
  12. G. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
    On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1771-1776 [Journal]
  13. Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich
    Reliability of visible GaN LEDs in plastic package. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1737-1742 [Journal]
  14. Ruggero Pintus, Simona Podda, Massimo Vanzi
    Image alignment for 3D reconstruction in a SEM. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1581-1584 [Journal]
  15. G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
    Reliability predictions in electronic industrial applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1321-1326 [Journal]
  16. G. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano
    Failure Analysis-assisted FMEA. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1795-1799 [Journal]
  17. M. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni
    High brightness GaN LEDs degradation during dc and pulsed stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1720-1724 [Journal]
  18. Reimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, Jose Franca, Christian Münker
    Life begins at 65: unless you are mixed signal? [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:936-941 [Conf]

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