K. Biswas, S. Rai Testable Realizations of CMOS Combinatorial Circuits for Voltage and Current Testing. [Citation Graph (0, 0)][DBLP] VLSI Design, 1994, pp:197-202 [Conf]
K. Biswas, S. Kal Etch characteristics of KOH, TMAH and dual doped TMAH for bulk micromachining of silicon. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2006, v:37, n:6, pp:519-525 [Journal]
K. Biswas, S. Das, S. Kal Analysis and prevention of convex corner undercutting in bulk micromachined silicon microstructures. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2006, v:37, n:8, pp:765-769 [Journal]
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