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Santiago Remersaro: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski
    Low Shift and Capture Power Scan Tests. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2007, pp:793-798 [Conf]

  2. A scalable method for the generation of small test sets. [Citation Graph (, )][DBLP]

  3. ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction. [Citation Graph (, )][DBLP]

  4. Scan-Based Tests with Low Switching Activity. [Citation Graph (, )][DBLP]

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