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Will Moore: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg
    Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:95-104 [Conf]
  2. Xinyue Fan, Will Moore, Camelia Hora, Mario H. Konijnenburg, Guido Gronthoud
    A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:266-271 [Conf]

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