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J. Najm: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel
    Cyclic stress tests for full scan circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:89-94 [Conf]

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