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José M. Miranda: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman
    Test Reuse at System Level. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:318-319 [Conf]
  2. José M. Miranda
    A BIST and Boundary-Scan Economics Framework. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:17-23 [Journal]
  3. Bradford G. Van Treuren, José M. Miranda
    Embedded Boundary Scan. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:2, pp:20-25 [Journal]

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