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Byoungho Kim: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hongjoong Shin, Byoungho Kim, Jacob A. Abraham
    Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:412-419 [Conf]
  2. Byoungho Kim, Zhenhai Fu, Jacob A. Abraham
    Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:291-296 [Conf]
  3. Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
    Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:199-204 [Conf]

  4. Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. [Citation Graph (, )][DBLP]


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