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Publications of Author

1. Nandu Tendolkar, Rajesh Raina, Rick Woltenberg, Xijiang Lin, Bruce Swanson, Greg Aldrich
   Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture. [Citation Graph (0, 0)][DBLP]
   VTS, 2002, pp:3-8 [Conf]
   
2. Vlado Vorisek, Bruce Swanson, Kun-Han Tsai, Dhiraj Goswami
   Improved Handling of False and Multicycle Paths in ATPG. [Citation Graph (0, 0)][DBLP]
   VTS, 2006, pp:160-165 [Conf]
   
3. Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli
   High-Frequency, At-Speed Scan Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2003, v:20, n:5, pp:17-25 [Journal]
   
4. 
   A Real Case of Significant Scan Test Cost Reduction. [Citation Graph (, )][DBLP]