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Kenji Okada: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Kenji Okada, Keiichi Noguchi, Kenji Okuyama, Struther Arnott
Win lals for a linked-atom least-square refinement program for helical polymers on windows PCs. [Citation Graph (0, 0)][DBLP]
Computational Biology and Chemistry, 2003, v:27, n:3, pp:265-285 [Journal] - Sachiko Okada, Kenji Okada
Detailed Differential Coefficients of Anomalous Dispersion Terms to Derivatives in Least-squares Refinement for X-ray Crystallography. [Citation Graph (0, 0)][DBLP]
Computers & Chemistry, 2000, v:24, n:2, pp:143-158 [Journal] - Sachiko Okada, Kenji Okada
X-ray Crystallographic Computer System DS*SYSTEM2for Some Organic Compounds. [Citation Graph (0, 0)][DBLP]
Computers & Chemistry, 1996, v:20, n:2, pp:267-270 [Journal] - Kenji Okada
Application of automated structure analysis to some organic compounds using PCs. 1. Automated Patterson techniques. [Citation Graph (0, 0)][DBLP]
Journal of Chemical Information and Computer Sciences, 1993, v:33, n:6, pp:871-878 [Journal] - Kenji Okada
Application of Direct Phasing Methods for Crystal Structure Analysis Using PCs. 2. Automation of the Symbolic-Addition Method. [Citation Graph (0, 0)][DBLP]
Journal of Chemical Information and Computer Sciences, 1994, v:34, n:3, pp:594-600 [Journal] - Sachiko Okada, Kenji Okada
Application of automated structure analysis to some organic compounds using PCs. 3. Crystallographic programs. [Citation Graph (0, 0)][DBLP]
Journal of Chemical Information and Computer Sciences, 1994, v:34, n:4, pp:972-975 [Journal] - Kenji Okada, Sachiko Okada
A DIRECT-SEARCHER Automatic System (Version 3) for Some Organic Compounds Running on Personal Computers. [Citation Graph (0, 0)][DBLP]
Journal of Chemical Information and Computer Sciences, 1997, v:37, n:3, pp:522-528 [Journal] - Wataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame
Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:7-8, pp:1041-1050 [Journal]
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