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Osei Poku: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
    Extracting Defect Density and Size Distributions from Product ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:5, pp:390-400 [Journal]

  2. Precise failure localization using automated layout analysis of diagnosis candidates. [Citation Graph (, )][DBLP]


  3. Automated failure population creation for validating integrated circuit diagnosis methods. [Citation Graph (, )][DBLP]


  4. Physically-Aware N-Detect Test Pattern Selection. [Citation Graph (, )][DBLP]


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