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Greg Yeric: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Greg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green
    Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:232-239 [Journal]
  2. Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian
    Making Manufacturing Work For You. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:107-108 [Conf]

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