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Icko Eric Timothy Iben: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Icko Eric Timothy Iben
    Head reliability of AMR sensors based on thermal stress tests. [Citation Graph (0, 0)][DBLP]
    IBM Journal of Research and Development, 2003, v:47, n:4, pp:415-428 [Journal]
  2. Icko Eric Timothy Iben, Yu-Min Lee, Wenchien D. Hsiao
    Steady-state thermal characteristics of AMR read/write heads used in tape storage drives. [Citation Graph (0, 0)][DBLP]
    IBM Journal of Research and Development, 2003, v:47, n:4, pp:401-414 [Journal]

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