J. P. Basu, Patrick L. Odell Effect of intraclass correlation among training samples on the misclassification probabilities of bayes procedure. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1974, v:6, n:1, pp:13-16 [Journal]
Raj S. Chhikara, Patrick L. Odell Discriminant analysis using certain normed exponential densities with emphasis on remote sensing application. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1973, v:5, n:3, pp:259-272 [Journal]
Patrick L. Odell A model for dimension reduction in pattern recognition using continuous data. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1979, v:11, n:1, pp:51-54 [Journal]
Dean M. Young, Patrick L. Odell A formulation and comparison of two linear feature selection techniques applicable to statistical classification. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1984, v:17, n:3, pp:331-337 [Journal]
Search in 0.001secs, Finished in 0.001secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP