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L. Ludwig: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. L. Ludwig, Elena P. Sapozhnikova, V. P. Lunin, Wolfgang Rosenstiel
    Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications. [Citation Graph (0, 0)][DBLP]
    Neural Computing and Applications, 2000, v:9, n:3, pp:202-210 [Journal]

  2. The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry. [Citation Graph (, )][DBLP]

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