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P. A. Crossley: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. H. Keith Nishihara, P. A. Crossley
    Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:17-30 [Journal]

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