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Yuji Takagi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yukinobu Sakata, Shun'ichi Kaneko, Yuji Takagi, Hirohito Okuda
    Successive pattern classification based on test feature classifier and its application to defect image classification. [Citation Graph (0, 0)][DBLP]
    Pattern Recognition, 2005, v:38, n:11, pp:1847-1856 [Journal]

  2. Practical Pattern Detection from Distributed Defect Points on a Semiconductor Wafer. [Citation Graph (, )][DBLP]


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