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Kazuma Sekiya: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Reza Aghaeizadeh Zoroofi, Hisashi Taketani, Shinichi Tamura, Yoshinobu Sato, Kazuma Sekiya
    Automated inspection of IC wafer contamination. [Citation Graph (0, 0)][DBLP]
    Pattern Recognition, 2001, v:34, n:6, pp:1307-1317 [Journal]

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