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Christian Galke: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Christian Galke, René Kothe, Heinrich Theodor Vierhaus
    Logic Self Repair. [Citation Graph (0, 0)][DBLP]
    ARCS Workshops, 2006, pp:36-44 [Conf]
  2. René Kothe, Christian Galke, S. Schultke, H. Froeschke, S. Gaede, Heinrich Theodor Vierhaus
    Hardware/Software Based Hierarchical Self Test for SoCs. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:159-160 [Conf]
  3. Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus
    Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. [Citation Graph (0, 0)][DBLP]
    DSD, 2006, pp:433-438 [Conf]
  4. Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus
    A Test Processor Concept for Systems-on-a-Chip. [Citation Graph (0, 0)][DBLP]
    ICCD, 2002, pp:210-0 [Conf]
  5. Claudia Kretzschmar, Christian Galke, Heinrich Theodor Vierhaus
    A Hierarchical Self Test Scheme for SoCs. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2004, pp:37-44 [Conf]
  6. Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus
    Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2003, pp:183-0 [Conf]
  7. Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus
    On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:178- [Conf]
  8. Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus
    On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:69-73 [Conf]
  9. René Kothe, Christian Galke, Heinrich Theodor Vierhaus
    A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:241-246 [Conf]
  10. Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus
    Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:181-182 [Conf]
  11. R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus
    A Configurable Modular Test Processor and Scan Controller Architecture. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2007, pp:277-284 [Conf]

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