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René Kothe: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Christian Galke, René Kothe, Heinrich Theodor Vierhaus
    Logic Self Repair. [Citation Graph (0, 0)][DBLP]
    ARCS Workshops, 2006, pp:36-44 [Conf]
  2. René Kothe, Christian Galke, S. Schultke, H. Froeschke, S. Gaede, Heinrich Theodor Vierhaus
    Hardware/Software Based Hierarchical Self Test for SoCs. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:159-160 [Conf]
  3. René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube
    Embedded Self Repair by Transistor and Gate Level Reconfiguration. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:210-215 [Conf]
  4. René Kothe, Heinrich Theodor Vierhaus
    Flip-Flops and Scan-Path Elements for Nanoelectronics. [Citation Graph (0, 0)][DBLP]
    DDECS, 2007, pp:307-312 [Conf]
  5. René Kothe, Christian Galke, Heinrich Theodor Vierhaus
    A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:241-246 [Conf]
  6. S. Habermann, René Kothe, Heinrich Theodor Vierhaus
    Built-in Self Repair by Reconfiguration of FPGAs. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:187-188 [Conf]
  7. Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus
    Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:181-182 [Conf]
  8. R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus
    A Configurable Modular Test Processor and Scan Controller Architecture. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2007, pp:277-284 [Conf]

  9. Embedded Diagnostic Logic Test Exploiting Regularity. [Citation Graph (, )][DBLP]

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