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Egor S. Sogomonyan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
    Self-checking Carry-selectAdder with Sum-bit Duplication. [Citation Graph (0, 0)][DBLP]
    ARCS Workshops, 2004, pp:84-91 [Conf]
  2. Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan
    Code-Disjoint Circuits for Parity Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:100-0 [Conf]
  3. Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
    New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:76-81 [Conf]
  4. Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel
    A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:365-0 [Conf]
  5. Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
    A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:1360-1361 [Conf]
  6. Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
    Partially Duplicated Code-Disjoint Carry-Skip Adder. [Citation Graph (0, 0)][DBLP]
    DFT, 2002, pp:78-86 [Conf]
  7. Egor S. Sogomonyan, Michael Gössel
    Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. [Citation Graph (0, 0)][DBLP]
    DFT, 1993, pp:239-246 [Conf]
  8. Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
    A New Self-Checking Code-Disjoint Carry-Skip Adder. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:39-43 [Conf]
  9. Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba
    Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2003, pp:35-0 [Conf]
  10. Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
    Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2001, pp:147-152 [Conf]
  11. Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
    A Modulo p Checked Self-Checking Carry Select Adder. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2003, pp:25-29 [Conf]
  12. Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel
    Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2004, pp:31-36 [Conf]
  13. Cristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande
    On-line Fault Detection and Location for NoC Interconnects. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:145-150 [Conf]
  14. Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
    A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:23-30 [Conf]
  15. Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring
    Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:286-293 [Conf]
  16. Michael Gössel, Egor S. Sogomonyan
    Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. [Citation Graph (0, 0)][DBLP]
    VLSI, 1993, pp:103-111 [Conf]
  17. Michael Gössel, Egor S. Sogomonyan, Adit D. Singh
    Scan-Path with Directly Duplicated and Inverted Duplicated Registers. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:47-52 [Conf]
  18. Michael Gössel, A. A. Morosov, Egor S. Sogomonyan
    A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:49-57 [Conf]
  19. Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan
    A linear code-preserving signature analyzer COPMISR. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:350-355 [Conf]
  20. Markus Seuring, Michael Gössel, Egor S. Sogomonyan
    A Structural Approach for Space Compaction for Concurrent Checking and BIST. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:354-361 [Conf]
  21. Egor S. Sogomonyan, Michael Gössel
    Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:138-144 [Conf]
  22. Egor S. Sogomonyan, A. A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh
    Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:184-189 [Conf]
  23. Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
    A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:324-331 [Conf]
  24. S. Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick
    Self-Checking Comparator with One Periodic Output. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1996, v:45, n:3, pp:379-380 [Journal]
  25. Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan
    Multimode scan: Test per clock BIST for IP cores. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2003, v:8, n:4, pp:491-505 [Journal]
  26. Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
    Modulo p=3 Checking for a Carry Select Adder. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:1, pp:101-107 [Journal]

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