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Dong S. Suk: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Dong S. Suk, Sudhakar M. Reddy
    Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1980, v:29, n:6, pp:419-429 [Journal]
  2. Dong S. Suk, Sudhakar M. Reddy
    A March Test for Functional Faults in Semiconductor Random Access Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1981, v:30, n:12, pp:982-985 [Journal]

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