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Publications of Author

1. Dong Xiang, Ming-Jing Chen, Kai-Wei Li, Yu-Liang Wu
   Scan-Based BIST Using an Improved Scan Forest Architecture. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:88-93 [Conf]
   
2. Dong Xiang, Kai-Wei Li, Hideo Fujiwara
   Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:318-323 [Conf]
   
3. Dong Xiang, Kaiwei Li, Jiaguang Sun, Hideo Fujiwara
   Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 2007, v:56, n:4, pp:557-562 [Journal]
   
4. 
   Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests. [Citation Graph (, )][DBLP]