The SCEAS System
Navigation Menu
Introduction
Collection Based
Clustering
Ranking
Paper Based
Journals
Conferences
DB Status
Statistics
Search

Search the dblp DataBase

Title:
Author:
Heiner Ryssel: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Walter Bohmayr, Alexander Burenkov, Jürgen Lorenz, Heiner Ryssel, Siegfried Selberherr
    Monte Carlo simulation of silicon amorphization during ion implantation. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:12, pp:1236-1243 [Journal]
  2. Jürgen Lorenz, Joachim Pelka, Heiner Ryssel, Albert Sachs, Albert Seidl, Milos Svoboda
    COMPOSITE -- A Complete Modeling Program of Silicon Technology. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:421-430 [Journal]
  3. M. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel
    Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:987-990 [Journal]
  4. Matthias Beichele, Anton J. Bauer, Heiner Ryssel
    Reliability of ultrathin nitrided oxides grown in low pressure N2O ambient. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:1089-1092 [Journal]
  5. S. Strobel, Anton J. Bauer, Matthias Beichele, Heiner Ryssel
    Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:1085-1088 [Journal]
  6. Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
    Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1253-1257 [Journal]
  7. Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
    Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:5-6, pp:819-822 [Journal]

Search in 0.001secs, Finished in 0.001secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
Introduction Collection Based Clustering Ranking Paper Based Journals Conferences DB Status Statistics Search
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002