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Pon Sung Ku: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sun Ku, Rajendran Panda
    A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. [Citation Graph (0, 0)][DBLP]
    ISQED, 2004, pp:232-237 [Conf]
  2. Haldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda
    Impact of stress-induced backflow on full-chip electromigration risk assessment. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:6, pp:1038-1046 [Journal]

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