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M. Gall: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. C. S. Murthy, M. Gall
    Process variation effects on circuit performance: TCAD simulation of 256-Mbit technology [DRAMs]. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:11, pp:1383-1389 [Journal]

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