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Tat-Kwan Yu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Tat-Kwan Yu, Sung-Mo Kang, I. N. Haji, Timothy N. Trick
    Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:6, pp:1013-1022 [Journal]

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