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Ramakrishna Voorakaranam: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ramakrishna Voorakaranam, Abhijit Chatterjee
    Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. [Citation Graph (0, 0)][DBLP]
    ARVLSI, 1999, pp:342-357 [Conf]
  2. Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee
    A Signature Test Framework for Rapid Production Testing of RF Circuits. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:186-191 [Conf]
  3. Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee
    Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:341-348 [Conf]
  4. Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao
    Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:903-912 [Conf]
  5. Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee
    Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1174-1181 [Conf]
  6. Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik
    Concurrent RF Test Using Optimized Modulated RF Stimuli. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:1017-1022 [Conf]
  7. Ramakrishna Voorakaranam, Abhijit Chatterjee
    Test Generation for Accurate Prediction of Analog Specifications. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:137-142 [Conf]
  8. Ramakrishna Voorakaranam, Abhijit Chatterjee
    Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:296-303 [Conf]

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