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Alexandre Schmid: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici, A. Ionescu, Oliver Soffke, Peter Zipf, Manfred Glesner, A. Rubio
    CONAN - A Design Exploration Framework for Reliable Nano-Electronics. [Citation Graph (0, 0)][DBLP]
    ASAP, 2005, pp:260-267 [Conf]
  2. Alexandre Schmid, Yusuf Leblebici
    A Highly Fault Tolerant PLA Architecture for Failure-Prone Nanometer CMOS and Novel Quantum Device Technologies. [Citation Graph (0, 0)][DBLP]
    DFT, 2004, pp:39-47 [Conf]
  3. Stéphane Badel, Alexandre Schmid, Yusuf Leblebici
    VLSI Realization of a Two-Dimensional Hamming Distance Comparator ANN for Image Processing Applications. [Citation Graph (0, 0)][DBLP]
    ESANN, 2003, pp:445-450 [Conf]
  4. Milos Stanisavljevic, Frank K. Gürkaynak, Alexandre Schmid, Yusuf Leblebici, Maria Gabrani
    Design and realization of a fault-tolerant 90nm CMOS cryptographic engine capable of performing under massive defect density. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2007, pp:204-207 [Conf]
  5. Stéphane Badel, Alexandre Schmid, Yusuf Leblebici
    Mixed analog-digital image processing circuit based on Hamming artificial neural network architecture. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2004, pp:780-783 [Conf]
  6. Takahide Oya, Tetsuya Asai, Yoshihito Amemiya, Alexandre Schmid, Yusuf Leblebici
    Single-electron circuit for inhibitory spiking neural network with fault-tolerant architecture. [Citation Graph (0, 0)][DBLP]
    ISCAS (3), 2005, pp:2535-2538 [Conf]
  7. Alexandre Schmid, Yusuf Leblebici
    Robust and fault-tolerant circuit design for nanometer-scale devices and single-electron transistors. [Citation Graph (0, 0)][DBLP]
    ISCAS (3), 2004, pp:685-688 [Conf]
  8. Alexandre Schmid, D. Bowler, R. Baumgartner, Yusuf Leblebici
    A novel analog-digital flash converter architecture based on capacitive threshold gates. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 1999, pp:172-175 [Conf]
  9. Takahide Oya, Alexandre Schmid, Tetsuya Asai, Yusuf Leblebici, Yoshihito Amemiya
    On the fault tolerance of a clustered single-electron neural network for differential enhancement. [Citation Graph (0, 0)][DBLP]
    IEICE Electronic Express, 2005, v:2, n:3, pp:76-80 [Journal]
  10. Alexandre Schmid, Yusuf Leblebici
    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2004, v:12, n:11, pp:1156-1166 [Journal]
  11. Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici
    A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on a-priori Functional Fault- Tolerance Analysis. [Citation Graph (0, 0)][DBLP]
    VLSI-SoC, 2005, pp:111-125 [Conf]

  12. Novel Front-End Circuit Architectures for Integrated Bio-Electronic Interfaces. [Citation Graph (, )][DBLP]


  13. Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR). [Citation Graph (, )][DBLP]


  14. Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density. [Citation Graph (, )][DBLP]


  15. Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth. [Citation Graph (, )][DBLP]


  16. CMOS compressed imaging by Random Convolution. [Citation Graph (, )][DBLP]


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