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James F. Plusquellic: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Abhishek Singh, Dhananjay S. Phatak, Tom Goff, Mike Riggs, James F. Plusquellic, Chintan Patel
    Comparison of Branching CORDIC Implementations. [Citation Graph (0, 0)][DBLP]
    ASAP, 2003, pp:215-225 [Conf]
  2. James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan
    Characterization of CMOS Defects using Transient Signal Analysis. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:93-101 [Conf]
  3. James F. Plusquellic, Amy Germida, Zheng Yan
    8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. [Citation Graph (0, 0)][DBLP]
    DFT, 1999, pp:68-76 [Conf]
  4. Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali
    Defect detection using power supply transient signal analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:67-76 [Conf]
  5. Chintan Patel, Fidel Muradali, James F. Plusquellic
    Power supply transient signal integration circuit. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:704-712 [Conf]
  6. James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan
    Digital Integrated Circuit Testing using Transient Signal Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:481-490 [Conf]
  7. James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan
    Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:40-49 [Conf]
  8. James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel
    Predicting device performance from pass/fail transient signal analysis data. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:1070-1079 [Conf]
  9. Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker
    Detecting delay faults using power supply transient signal analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:395-404 [Conf]
  10. Amy Germida, James F. Plusquellic
    Detection of CMOS Defects under Variable Processing Conditions. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:195-204 [Conf]
  11. Sanat Kamal Bahl, James F. Plusquellic, Joseph Thomas
    A Comparitive Study of W-cdma Cell Search Designs. [Citation Graph (0, 0)][DBLP]
    Journal of Circuits, Systems, and Computers, 2005, v:14, n:1, pp:129-136 [Journal]
  12. James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker
    Power supply transient signal analysis for defect-oriented test. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:3, pp:370-374 [Journal]

  13. Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis. [Citation Graph (, )][DBLP]


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