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Publications of Author

1. H. Yabuhara, Mauro Ciappa, Wolfgang Fichtner
   Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:9-10, pp:1459-1463 [Journal]
   
2. Mauro Ciappa, Flavio Carbognani, P. Cova, Wolfgang Fichtner
   A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:9-11, pp:1653-1658 [Journal]
   
3. Maria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner
   Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:9-11, pp:1701-1706 [Journal]
   
4. Mauro Ciappa
   Selected failure mechanisms of modern power modules. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:4-5, pp:653-667 [Journal]
   
5. Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
   A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:9-11, pp:1651-1656 [Journal]
   
6. G. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
   On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:9-11, pp:1771-1776 [Journal]
   
7. Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
   Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:9-11, pp:1499-1504 [Journal]
   
8. Mauro Ciappa
   Lifetime prediction on the base of mission profiles. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:9-11, pp:1293-1298 [Journal]
   
9. Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
   Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:9-11, pp:1532-1537 [Journal]
   
10. Mauro Ciappa, Wolfgang Fichtner, T. Kojima, Y. Yamada, Y. Nishibe
    Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1694-1699 [Journal]
    
11. Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner
    Characterization of photonic devices by secondary electron potential contrast. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1536-1541 [Journal]
    
12. Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet
    Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1754-1759 [Journal]
    
13. D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner
    New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1772-1777 [Journal]
    
14. 
    Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. [Citation Graph (, )][DBLP]
    
    
15. 
    Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. [Citation Graph (, )][DBLP]