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J. Komori:
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Publications of Author
- T. Koyama, M. Umeno, K. Sonoda, J. Komori, Y. Mashiko
Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:8, pp:1243-1253 [Journal]
- M. K. Mazumder, S. Yamamoto, H. Maeda, J. Komori, Y. Mashiko
Mechanism of pre-annealing effect on electromigration immunity of Al-Cu line. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:8, pp:1259-1264 [Journal]
- A. Teramoto, H. Umeda, K. Azamawari, K. Kobayashi, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi
Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:1, pp:47-52 [Journal]
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