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Koji Eriguchi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Koji Eriguchi, Yoshinao Harada, Masaaki Niwa
    Effects of base layer thickness on reliability of CVD Si3N4 stack gate dielectrics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:4, pp:587-595 [Journal]
  2. Takayuki Yamada, Masaru Moriwaki, Yoshinao Harada, Shinji Fujii, Koji Eriguchi
    Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:697-704 [Journal]

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