SCEAS

The SCEAS System

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Milan Jevtic: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Milan Jevtic
Optimal Reliability Design: Fundamentals and Applications; Way Kuo, Rajendra Prasad, Frank A. Tillman, Ching-Lai Mwang. Cambridge University Press, Cambridge, 2001, 389+XXI pp. ISBN: 0-521-78127-2 (hardbound). [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:4, pp:623-624 [Journal]
Milan Jevtic, Z. Stanimirovic, I. Stanimirovic
Evaluation of thick-film resistor structural parameters based on noise index measurements. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:1, pp:59-66 [Journal]
Milan Jevtic
Guidebook for Managing Silicon Chip Reliability; Michael G. Pecht, Riko Radojcic, Gopal Rao. CRC Press LLC, Boca Raton, 1999, 224 pp. ISBN: 0-8493-9624-7. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:1, pp:141-142 [Journal]
I. Stanimirovic, Milan Jevtic, Z. Stanimirovic
High-voltage pulse stressing of thick-film resistors and noise. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:6, pp:905-911 [Journal]
Milan Jevtic
Low frequency noise as a tool to study optocouplers with phototransistors. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2004, v:44, n:7, pp:1123-1129 [Journal]
Milan Jevtic, Jovan M. Hadzi-Vukovic
Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2007, v:47, n:1, pp:51-58 [Journal]

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