Search the dblp DataBase

Publications of Author

1. D. Brazzelli, G. Ghidini, C. Riva
   Optimization of WSi₂ by SiH₄ CVD: impact on oxide quality. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:7, pp:1003-1006 [Journal]
   
2. G. Ghidini, D. Brazzelli
   Evaluation methodology of thin dielectrics for non-volatile memory application. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:9-11, pp:1473-1480 [Journal]
   
3. A. Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, A. Pavan
   Anomalous gate oxide conduction on isolation edges: analysis and process optimization. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:8, pp:1229-1235 [Journal]
   
4. G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia
   Impact of interface and bulk trapped charges on transistor reliability. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:5-6, pp:857-860 [Journal]