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Patrick Juliano: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum
    Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:11, pp:1781-1787 [Journal]
  2. Jie Wu, Patrick Juliano, Elyse Rosenbaum
    Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:11, pp:1771-1779 [Journal]

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