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Roberto Menozzi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. M. Borgarino, Roberto Menozzi, D. Dieci, L. Cattani, Fausto Fantini
    Reliability physics of compound semiconductor transistors for microwave applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:1, pp:21-30 [Journal]
  2. Wallace T. Anderson, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:8, pp:1101- [Journal]
  3. P. Cova, Roberto Menozzi, M. Dammann, T. Feltgen, W. Jantz
    High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1587-1592 [Journal]
  4. Giovanna Sozzi, Roberto Menozzi
    High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:1, pp:53-59 [Journal]
  5. Wallace T. Anderson, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:7, pp:995- [Journal]
  6. Wallace T. Anderson, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:821- [Journal]
  7. P. Cova, Roberto Menozzi, M. Portesine
    Power p-i-n diodes for snubberless application: H+ irradiation for soft and reliable reverse recovery. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:1, pp:81-87 [Journal]
  8. Peter Ersland, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:7, pp:1031- [Journal]
  9. P. Cova, N. Delmonte, Roberto Menozzi
    On state breakdown in PHEMTs and its temperature dependence. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1605-1610 [Journal]
  10. Peter Ersland, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:12, pp:1868- [Journal]
  11. P. Cova, N. Delmonte, Roberto Menozzi
    Thermal characterization and modeling of power hybrid converters for distributed power systems. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1760-1765 [Journal]
  12. Peter Ersland, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:8, pp:1217- [Journal]
  13. Giovanna Sozzi, Roberto Menozzi
    A review of the use of electro-thermal simulations for the analysis of heterostructure FETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2007, v:47, n:1, pp:65-73 [Journal]
  14. P. Cova, Roberto Menozzi, M. Portesine
    Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:5, pp:409-416 [Journal]

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